Course Description
Introduction to imaging and diffraction analysis with transmission electron microscopy. Common sample preparation techniques. Basic diffraction theory and imaging principles using different imaging techniques, including bright field, dark field, high resolution and z-contrast imaging. Working principles of related compositional analysis techniques, including energy dispersive X-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS). Hands-on operation of the microscope can be optional.
Intended Learning Outcomes
CILO-1: Students will be able to explain the working principles of transmission electron microscopy, including theories of electron diffraction, imaging, energy dispersive X-ray spectroscopy (EDS), and basic crystallography, etc.
CILO-2: Students will be able to operate the transmission electron microscope for basic imaging, high resolution imaging, diffraction pattern acquisition, and EDS mapping, etc.
CILO-3: Students will be able to perform systematic analysis on the crystalline structures, crystalline orientation dependence and defect characteristics of various samples using high resolution images and diffraction patterns.
CILO-4: Students will be able to design experiments to study novel materials with the microscope, i.e. sample preparation and imaging strategies, to investigate the specific material properties of interest.