Course Description
Overview of analytical techniques. Optical and electron microscopy. Atomic force Microscopy. Nanoindentation. Structural, chemical and surface analyses: X-ray diffractometry. X-ray energy dispersive analysis. X-ray photoelectron spectroscopy. Fourier transform infrared spectroscopy. Differential scanning calorimetry. Thermal gravimetric analysis. Nondestructive testing methods.
Intended Learning Outcomes
CILO-1: Students will be able to describe the basic knowledge on various techniques, such as XRD, XPS, TEM, SEM, SIMS, and Raman.
CILO-2: Students will be able to operate the equipment, such as XRD, XPS, TEM, and SEM, after training.
CILO-3: Students will be able to apply the skills and knowledge for materials characterizations, such as composition, crystal structure, and electronic structure.
CILO-4: Students will be able to improve the performance of facility based on the research and technological needs.