Course Description
Introduction of commonly used materials characterization methods (XPS, SEM, AFM, XRD, Raman, XPS), including their theory of operation and hands-on experience. Includes a discussion of the measurement process and instrumental analysis of samples.
Intended Learning Outcomes
CILO-1: Interpret the basic working principles of the most commonly used materials characterization techniques.
CILO-2: Interpret the results obtained from the various characterization techniques.
CILO-3: Demonstrate the basic operations on some selected characterization tools.
CILO-4: Design and simulate the own experiments for characterizing samples in own research.
CILO-5: Communicate effectively through clear and concise language and visual aids to describe and evaluate materials characterization methods.